Abstract
In recent years, interest in the performance of small dimension resistors has increased primarily due to the need to reduce parasitic resistance in high frequency applications. This paper presents results on the characterization of thick film microresistors, i.e. resistors of 80 × 80 mil to 10 × 10 mil dimension.The thickness, sheet resistance and temperature coefficient of resistance were dependent on the resistor length, whereas, thermal ageing drift and the thermal cycling drift values did not exhibit any such dependence.With reasonable precautions and optimization of the manufacturing conditions highly stable and good quality microresistors can be fabricated.