Elastic Membrane That Undergoes Mechanical Deformation Enhances Osteoblast Cellular Attachment and Proliferation
Figure 3
(a) Representative AFM images of a raw and unclean Si membrane surfaces. Roughness analysis done on a 10 m scan size of the images indicated that the Surface roughness (Ra) on these surfaces was 0.8 nm; while the RMS roughness value was 1.0 nm. (b) Representative AFM images of a non-UVO-activated water-cleaned Si membrane surface. Roughness analysis on a 10 m scan size of the images indicated that the Surface roughness (Ra) on these surfaces was 1.2 nm; while the RMS roughness value was 1.4 nm. (c) Representative AFM images of a 10 min UVO-activated Si membrane surface. Roughness analysis on a 10 m scan size of the images indicated that the Surface roughness (Ra) on these surfaces was 1.9 nm; while the RMS roughness value was 2.4 nm. (d) Representative AFM images of a 30 min UVO-activated Si membrane surface. Roughness analysis on a 10 m scan size of the images indicated that the Surface roughness (Ra) on these surfaces was 4.7 nm; while the RMS roughness value was 5.9 nm.
