Overview on Radiation Damage Effects and Protection Techniques in Microelectronic Devices

Table 2

Classification and definition of single-particle effect [34].

Mistake	Type	Definition
Soft error	Single event upset	Change of logical state in storage units
	Single event multibit flip	Bit storage state change
	Single event disturbances	Transient change in storage unit
	Single event transient	Transient voltage change caused by current
Hard error	Single event latch	Regenerative state of high current in PN structure
	Single event burnout	High current leads to device burnout
	Single event gate rupture	The gate dielectric breaks down due to the large current flowing through it
	Single-event displacement damage	Permanent damage caused by displacement effect
	Single event functional interrupt	Control component malfunction caused by flipping
	Single bit error	Errors that occur in a single bit and cannot be corrected or recovered