Electrical and Dielectric Characterization of Bi₁₂GeO₂₀ Prepared by Modified Pechini Method

Figure 5

X-ray diffraction patterns of the samples C450 (calcined at 450°C/1 h and sintered at 750°C/1 h) and C600 (calcined at 600°C/1 h and sintered at 750°C/1 h).