Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy

<table>(a) Long-time retention characteristics at various electric fields (75 to 300 kV/cm), and (b) the long-time retention characteristics (<svg height="13.75" id="M24" style="vertical-align:-0.0pt" version="1.1" viewbox="0 0 17.299999 13.75" width="17.299999" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
<g transform="matrix(.017,-0,0,-.017,.062,13.688)"><path d="M46 650h247q112 0 169 -41q64 -49 64 -141q0 -91 -56.5 -143t-138.5 -62q-23 -3 -45 -1l-74 19v-157q0 -63 15.5 -77t83.5 -19v-28h-271v28q60 5 74 20t14 77v400q0 65 -12.5 79t-69.5 18v28zM212 559v-245q31 -12 73 -12q59 0 102 38t43 124q0 77 -42.5 115.5
t-108.5 38.5q-44 0 -56 -12q-11 -8 -11 -47z" id="x50"></path></g>
<g transform="matrix(.012,-0,0,-.012,9.637,5.525)"><path d="M471 153q-22 -15 -61 -13q-25 31 -45.5 49.5t-56.5 41.5q4 -71 28 -134q-17 -33 -42 -46q-24 12 -42 46q24 63 28 134q-36 -23 -56.5 -41.5t-45.5 -49.5q-36 -2 -61 13q0 28 19 59q65 10 130 43q-65 33 -130 43q-19 31 -19 59q22 15 61 13q25 -31 45.5 -49.5t56.5 -41.5
q-4 71 -28 134q17 33 42 46q24 -12 42 -46q-24 -63 -28 -134q36 23 56.5 41.5t45.5 49.5q36 2 61 -13q0 -28 -19 -59q-65 -10 -130 -43q65 -33 130 -43q19 -31 19 -59z" id="x2217"></path></g>
</svg> and <svg height="14.8" id="M25" style="vertical-align:-0.0pt" version="1.1" viewbox="0 0 17.299999 14.8" width="17.299999" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
<g transform="matrix(.017,-0,0,-.017,.062,14.737)"><path d="M46 650h247q112 0 169 -41q64 -49 64 -141q0 -91 -56.5 -143t-138.5 -62q-23 -3 -45 -1l-74 19v-157q0 -63 15.5 -77t83.5 -19v-28h-271v28q60 5 74 20t14 77v400q0 65 -12.5 79t-69.5 18v28zM212 559v-245q31 -12 73 -12q59 0 102 38t43 124q0 77 -42.5 115.5
t-108.5 38.5q-44 0 -56 -12q-11 -8 -11 -47z" id="x50"></path></g>
<g transform="matrix(.012,-0,0,-.012,9.637,6.587)"><path d="M574 0h-62l-217 479h-2l-217 -479h-62l249 548h62z" id="x2227"></path></g>
</svg>)  measured at an applied electric field of 150 kV/cm for CBTi144 thin film deposited on (100) Pt/Ti/SiO<sub>2</sub>/Si substrate at 700<svg height="12.9375" id="M26" style="vertical-align:-0.0pt" version="1.1" viewbox="0 0 5.1624999 12.9375" width="5.1624999" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
<g transform="matrix(.012,-0,0,-.012,.062,4.712)"><path d="M326 255q0 -56 -41 -96t-99 -40t-99 40t-41 96t41 96t99 40t99 -40t41 -96zM274 255q0 38 -25.5 65t-62.5 27t-62.5 -27t-25.5 -65t25.5 -65t62.5 -27t62.5 27t25.5 65z" id="x2218"></path></g>
</svg>C for 2 hours.</table>

Advances in Materials Science and Engineering

fig7

Figure 7

Figure 7: Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy 