High Reliability and Fast-Speed Phase-Change Memory Based on Sb<sub>70</sub>Se<sub>30</sub>/SiO<sub>2</sub> Multilayer Thin Films

<div>Plots of failure times as a function of reciprocal temperature of SbSe and SbSe/SiO multilayer thin films.</div>

Advances in Materials Science and Engineering

Figure 2: High Reliability and Fast-Speed Phase-Change Memory Based on Sb<sub>70</sub>Se<sub>30</sub>/SiO<sub>2</sub> Multilayer Thin Films 