Research Article
Thermal-Aware Test Schedule and TAM Co-Optimization for Three-Dimensional IC
| begin | | Get an initialize schedule ; | | Get an initialize temperature > 0; | | Set the temperature threshold ; | | Set the decay rate < 1; | | while < do | | for 1 ≦ ≦ do | | next a random selected perturbation of current | | value[next] − value[current] | | if < 0 then current next | | else current next only with probability | | ; | | end for | | end while |
|