Research Article
Thermal-Aware Test Schedule and TAM Co-Optimization for Three-Dimensional IC
Table 5
Temperature comparison for hard-die mode.
| | Test case | HotSpot (°K) | Proposed (°K) | Error |
| | Case 1 | 362.10 | 362.68 | 0.16% | | Case 2 | 354.98 | 356.86 | 0.52% | | Case 3 | 361.47 | 362.89 | 0.39% |
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