Simultaneously Remove and Visually Detect Ce⁴⁺ Based on Nanocomposite of UiO-66-NH₂/CPA-MA

Figure 1

(a) XRD patterns of UiO-66-NH₂ and UA composite. (b) FT-IR spectrum of UiO-66-NH₂ and UA composite. SEM and TEM images of UA (c)–(e). Elements mapping analysis and EDX pattern of UA (f, g).

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