Experimental Study of the Influence of the Adsorbate Layer Composition on the Wetting of Different Substrates with Water

Figure 2

XPS survey and detail spectra of a gold-sputtered silicon wafer measured at a detector angle of 90° to the surface, after cleaning three times in a supersonic bath with cyclohexane (CCC sample). Counts per second (CPS) are plotted as function of electron binding energy.

(a) Survey spectrum

(b) Au4f detail spectrum

(c) C1s detail spectrum

(d) O1s detail spectrum