Enhancing Scheduling Performance for a Wafer Fabrication Factory: The Biobjective Slack-Diversifying Nonlinear Fluctuation-Smoothing Rule

Table 5

The results of Wilcoxon sign-rank test.

	Ha0	Hb0
FIFO	Z = 2.02**	Z = 1.48
EDD	1.21	2.02**
SRPT	0.94	2.02**
CR	1.75*	2.02**
FSMCT	2.02**	0.67
FSVCT	1.21	2.02**
1f-TNFSMCT	2.02**	2.02**
1f-TNFSVCT	2.02**	−0.40
4f-biNFS	2.02**	2.02**

* 𝑃<0.05, **𝑃<0.025, ***𝑃<0.01.