Research Article

Online Semisupervised Learning Approach for Quality Monitoring of Complex Manufacturing Process

Table 1

List of notations.

NotationMeaning

data batch in data streams
Single input data vector and single ground truth output vector separately
Input data batch and batch label
The current network parameters and optimal network parameters
Network parameter importance, calculated by (3)
Regularization factor:
, Predefined thresholds in (2)
The cardinality of the cluster
The cardinality of the class of the cluster
Convolution layer
Feature map
Cluster center
Partially destroyed input vector with the masking noise
The distance between two data samples
The contribution of cluster
The mixing coefficient for hidden node pruning criterion
Reconstructed symbol

ACMAutonomous clustering mechanism
oriOriginal data
augAugmented data (generation of augmented label of Section 3)
psPseudodata (generation of pseudolabel of Section 3)