Research Article
Online Semisupervised Learning Approach for Quality Monitoring of Complex Manufacturing Process
| Notation | Meaning |
| | data batch in data streams | | Single input data vector and single ground truth output vector separately | | Input data batch and batch label | | The current network parameters and optimal network parameters | | Network parameter importance, calculated by (3) | | Regularization factor: | , | Predefined thresholds in (2) | | The cardinality of the cluster | | The cardinality of the class of the cluster | | Convolution layer | | Feature map | | Cluster center | | Partially destroyed input vector with the masking noise | | The distance between two data samples | | The contribution of cluster | | The mixing coefficient for hidden node pruning criterion | | Reconstructed symbol |
| ACM | Autonomous clustering mechanism | ori | Original data | aug | Augmented data (generation of augmented label of Section 3) | ps | Pseudodata (generation of pseudolabel of Section 3) |
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