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IET Circuits, Devices & Systems
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IET Circuits, Devices & Systems
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2023
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Article
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Fig 8
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Research Article
A 7-nm-Based 5R4W High-Timing Reliability Regfile Circuit
Figure 8
Single-word line error detection technique: (a) single word line error detection structure and (b) single word line error detection implementation.
(a)
(b)