Research Article

A 7-nm-Based 5R4W High-Timing Reliability Regfile Circuit

Table 1

Simulation PVT environment table.

ProcessVoltageTemperatureRC condition

FF0.825125CC best
SS0.675−40CC worst
TT0.7585Typical
FF0.935125CC best
SS0.765−40CC worst
TT0.8585Typical
FF0.825−40CC best
SS0.675125CC worst
FF0.935−40CC best
SS0.765125CC worst
FF1.02125CC best
FF1.02−40CC best
FF1.02125CC worst
FF1.02−40CC worst
SS1.02125CC best
SS1.02−40CC best
SS1.02125CC worst
SS1.02−40CC worst
FF0.585125CC best
FF0.585−40CC best
FF0.585125CC worst
FF0.585−40CC worst
SS0.585125CC best
SS0.585−40CC best
SS0.585125CC worst
SS0.585−40CC worst