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IET Circuits, Devices & Systems
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IET Circuits, Devices & Systems
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2023
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Article
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Fig 10
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Research Article
The Design and Process Reliability Analysis of Millimeter Wave CMOS Power Amplifier with a Cold Mode MOSFET Linearization
Figure 10
The effect of process corners on (a) PAE and (b) power gain.
(a)
(b)