A Different, Nondestructive Method of Investigating In Situ Degradation in Hybrid Perovskite Solar Cells

Figure 1

(a) Device layer stack of the HOIP solar cell; (b) measured and fitted transmittance and reflectance spectra of the active layer MAPI thin film; (c, d) comparison of MAPI’s optical constant obtained in this work to the ones in literature [17, 19]; (e, f) Refractive index and extinction coefficient of other solar cell layers.

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