A Different, Nondestructive Method of Investigating In Situ Degradation in Hybrid Perovskite Solar Cells

Table 1

The measured thicknesses compared to the thickness obtained from optical modelling of the thin films deposited on a 1.1 mm glass substrate.

Layer	Measured thickness (in nm)	Thickness (in nm) by optical modelling
ITO	^+	179.2
PEDOT:PSS		67.5
MAPI		307.4
PCBM		53.6
BCP	21.5	21.4
Al	314.6	320.4

The films were measured using laser microscopy except ⁺provided by the supplier and measured by quartz crystal in situ film thickness monitor.