Design of Artificial Metamaterial Absorber Based on Stacking Method

Figure 11

Fabrication process of the sample and waveguide measurement method. (a) Metallic patterned films on the silicon materials. (b) Each metal-dielectric layer after cutting. (c) Individual sample sandwiched using adhesive. (d) Environment of waveguide measurement. (e) Comparison of between the numerical results and experimental results. (f) Comparison of normalized absorption between the numerical results and experimental results.

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