High-Temperature Measurement Technology for Microwave Surface Resistance of Metal Materials

<table class="table-group" id="tab4"><tr><td><table class="table"><tr><td class="thead-hr" colspan="3"><hr/></td></tr><tr class="thead"><td class="align_left">Roughness (<i>μ</i>m)</td><td class="align_center"><span style="width: 9.52083ptpx;"><svg height="10.7866pt" id="M78" style="vertical-align:-2.150701pt" version="1.1" viewbox="-0.0498162 -8.6359 9.52083 10.7866" width="9.52083pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M699 368C699 549 574 666 407 666C186 666 23 488 23 277C23 113 129 -3 288 -13L307 -26C431 -111 501 -139 533 -147C559 -154 613 -163 658 -164L666 -141C597 -111 507 -66 430 -11L416 -1C580 42 699 190 699 368ZM601 371C601 227 518 54 381 22L354 40L278 24C175 47 120 145 120 269C120 451 235 631 398 631C540 631 601 521 601 371Z"></path></g></svg></span></td><td class="align_center"><svg height="11.927pt" id="M79" style="vertical-align:-3.291101pt" version="1.1" viewbox="-0.0498162 -8.6359 16.6425 11.927" width="16.6425pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M610 18C585 26 567 34 540 68C517 97 499 128 476 171C452 215 425 276 413 304C496 332 570 394 570 494C570 555 545 595 509 619S419 650 364 650H139L133 622C216 615 219 612 203 527L129 132C112 40 105 36 23 28L17 0H279L285 28C199 34 194 40 211 132L239 284H284C320 284 334 275 351 236C374 182 394 140 420 93C459 23 495 -1 592 -8H600L610 18ZM480 485C480 424 449 372 403 342C374 323 338 316 293 316H245L291 562C296 589 301 601 311 608S337 618 358 618C432 618 480 575 480 485Z"></path></g><g transform="matrix(.0091,0,0,-0.0091,8.086,3.132)"><path d="M357 391C357 416 325 451 270 451C241 451 179 431 146 400C109 365 97 334 97 307C97 248 143 213 196 180C250 146 261 123 261 101C261 75 237 40 190 40C153 40 110 72 86 109C81 116 68 119 55 112C37 102 24 87 24 66C24 30 85 -12 137 -12C229 -12 331 62 331 140C331 189 304 218 236 260C197 284 164 309 164 346C164 381 194 400 220 400C259 400 282 380 304 350C310 342 321 339 330 344C347 353 357 372 357 391Z"></path></g><g transform="matrix(.0091,0,0,-0.0091,11.553,3.132)"><path d="M290 377C321 398 342 415 358 430C378 450 389 473 389 502C389 578 329 635 238 635H237C184 635 137 610 109 578L64 515L88 493C112 529 154 573 208 573S303 542 303 482C303 409 233 370 141 341L149 308C165 313 190 319 215 319C272 319 341 283 341 193C342 98 292 43 222 43C163 43 122 72 96 94C88 101 79 100 70 94C61 87 47 73 46 60C44 47 48 37 62 23C76 10 118 -12 165 -12C238 -12 430 62 430 223C430 297 379 359 290 375V377Z"></path></g></svg> (m<i>Ω</i>)</td></tr><tr><td class="thead-hr" colspan="3"><hr/></td></tr><tr><td class="align_left">0</td><td class="align_center">28354</td><td class="align_center">31.5</td></tr><tr><td class="align_left">1</td><td class="align_center">28352</td><td class="align_center">31.6</td></tr><tr><td class="align_left">2</td><td class="align_center">28220</td><td class="align_center">37.0</td></tr><tr><td class="align_left">3</td><td class="align_center">26708</td><td class="align_center">102.0</td></tr><tr><td class="align_left">4</td><td class="align_center">24186</td><td class="align_center">228.7</td></tr><tr><td class="align_left">5</td><td class="align_center">21942</td><td class="align_center">365.9</td></tr><tr><td class="align_left">7</td><td class="align_center">19060</td><td class="align_center">589.4</td></tr><tr><td class="align_left">9</td><td class="align_center">17518</td><td class="align_center">739.2</td></tr><tr><td class="align_left">11</td><td class="align_center">16623</td><td class="align_center">838.9</td></tr><tr class="table-tr"><td colspan="3"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

<div>Simulated quality factors of TE<sub>011</sub> mode corresponding to different surface roughness.</div>

International Journal of RF and Microwave Computer-Aided Engineering

tab4

Table 4

Table 4: High-Temperature Measurement Technology for Microwave Surface Resistance of Metal Materials 