Performance Analysis of a Kretschmann-Based Ag-ITO-Au Surface Plasmon Resonance Sensor through Numerical Simulations

Figure 3

Changes in chip reflectivity when thicknesses of Ag and ITO change from 10 to 50; the red line represents the best structure; the green line in (b) represents the reflectivity of the chip when ITO thickness is 120; (f) the electromagnetic field distribution corresponding to the structure represented by the red line in (b) (unit: nm).

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