Nanostructured Dielectric Layer for Ultrathin Crystalline Silicon Solar Cells

<div>Simulated antireflection properties of SiN<sub>x</sub> NDL. (a) Spectral reflectance of SiN<sub>x</sub> NDL with refractive index from 1.9 to 2.1 and normal incident light from 300 nm to 900 nm. (b) Simulation result of integrated overall angular reflectance under AM 1.5G of SLARC (red), DLARC (green), and SiN<sub>x</sub> NDL with reflective index of 2.1 (blue).</div>

International Journal of Photoenergy

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Figure 2

Figure 2: Nanostructured Dielectric Layer for Ultrathin Crystalline Silicon Solar Cells 