In Situ Low-Temperature Chemical Bath Deposition of CdS Thin Films without Thickness Limitation: Structural and Optical Properties

Figure 3

X-ray diffraction analysis of CdS thin films. (a) XRD spectra of the as-deposited and annealed CdS films. (b) Variation of the maximum intensity of the (111) peak as a function of the annealing temperature. (c) Variation of the grain size with the annealing temperature.

(a)

(b)

(c)