Research Article
The Impact of the Speed and Temperature Variation on the Electric Vehicles Reliability
Table 5
Characteristics of the semiconductor devices [
8].
| k | 0.00008617 eV/K |
| rm | 0.05 ohm | fr1 | 0.0001306 | fr2 | 0.001589 | fr3 | 0.00053 | fr4 | 0.00295 | dcop | 0.23 | dcnonop | 0.77 | dT | 80 | Ea-op | 0.3 | Ea-non-op | 0.4 | rch-IGBT | 15 K/kw | rch-diode | 23 K/kw | U0-IGBT | 1.5 kV | U0-diode | 0.84 kV | rdiode | 0.09 ohm | rIGBT | 0.06 ohm | m | 0.5 | Udc | 600 V | Unom | 750 V | Psw | 3 kHz | rth | 0.55 K/kw |
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