Research Article
Quantitative Analysis and Band Gap Determination for CIGS Absorber Layers Using Surface Techniques
Figure 2
Calibration curves between the intensity ratios for fs-LA-ICP-MS and the concentration ratios for XRF measurement (71Ga/77Se, 115In/77Se, 71Ga/65Cu, 115In/65Cu, and 71Ga/115In ratios, respectively).
| (a) |
| (b) |
| (c) |