Effect of Low-Frequency Alternative-Current Magnetic Susceptibility in Ni₈₀Fe₂₀ Thin Films

Figure 1

X-ray diffraction patterns of NiFe films with thicknesses from 300 Å to 1000 Å under three preparation conditions: (a) deposited at RT only, (b) postannealed at 𝑇_A=150°C for 1 h, and (c) postannealed at 𝑇_A=250°C for 1 h.

(a)

(b)

(c)