Research Article

Influence of Annealing and UV Irradiation on Hydrophilicity of Ag- T i O 𝟐 Nanostructured Thin Films

Figure 2

XRD patterns of Ag-TiO2 films on silicon substrate (a) as-deposited and annealed at 900Β°C for (b) 15, (c) 30, (d) 60, (e) 90, and (f) 120 min.
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