Void Structures in Regularly Patterned ZnO Nanorods Grown with the Hydrothermal Method
Figure 6
(a) SEM image of four fallen undoped ZnO NRs before thermal annealing. (b) SEM image of the sample in (a) after thermal annealing at 300°C for 60 min with ambient oxygen. (c) SEM image of the sample in (b) after the second annealing process at 400°C for 60 min with ambient oxygen. (d) SEM image of the sample in (c) after the third annealing process at 500°C for 60 min with ambient oxygen. (e)–(h) BSEM images corresponding to the SEM images in parts (a)–(d), respectively. The undoped ZnO NRs are grown under the standard condition.
