Influence of the DEA Concentration on Structural and Optical Properties of Nanodot PbS Thin Films Growth by Chemical Solution Deposition: Unveiling Dual Optical Absorption Edges

Table 1

The measured values of mean diameter (d), mean height (h), average line surface roughness (Ra), line root-mean-square roughness (L_rms = Rq), average area surface roughness (Ra), area root-mean-square roughness (S_rms = Sq), thickness, and growth rate of the PbS-QDs thin films deposited at various molarities of DEA.

Sample no.	DEA (M)	D (nm)	h (nm)	Ra (nm)	Rq (nm)	Sa (nm)	Sq (nm)	Thickness (nm)	Growth rate (nm/s)
S1	0.4	89.4	6.8	5.5	6.9	5.7	7.0	78.6	0.06
S2	1.2	94.6	13.6	5.8	7.2	6.3	7.6	84.6	0.05
S3	2.0	117.5	18.2	7.5	9.2	7.5	9.3	126.8	0.12