A Fast Postprocessing Algorithm for the Overlapping Problem in Wafer Map Detection

Table 1

The basic experimental parameter settings of the baseline.

Baseline	Learning rate	Weight decay
[22, 35, 36]	0.02	0.0001
Cascade Mask R-CNN [21]	0.002	0.0001
Grid R-CNN [34]	0.002	0.0001
SSD 300 [9]	0.002	0.0005
YOLO v3 [23]	0.001	0.0005
RetinaNet [10]	0.01	0.0001