Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon

Figure 10

Intensity distributions of Raman modes in the HV case under the oblique backscattering configuration (β = 30°) for different polarization directions φ and sample rotation angles: (a) α = 0°, (b) α = 15°, (c) α = 30°, and (d) α = 45°.

(a)

(b)

(c)

(d)