Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon

<div>Intensity distributions of Raman modes in the HV case under the oblique backscattering configuration (<i>β</i> = 30°) for (a) a fixed polarization direction <i>φ</i> = 0° but a rotated sample rotation angle <i>α</i> and (b) a fixed sample rotation angle <i>α</i> = 0° but a rotated polarization direction <i>φ</i> (<i>γ</i> = <i>φ</i> + 90°).</div>

Journal of Spectroscopy

fig11

Figure 11

Figure 11: Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon 