Analysis of Destructive Effects with Electron Bombardment in Slow-Wave Structures

Figure 8

Microscopic images of damage traces on witness plates made of SS using a SEM (a–c) and a CLSM (d, e). (a) Corrugated morphologies appear at a diode voltage of 163 kV and diode current of 1.59 kA. (b) Craters emerge in the vicinity of corrugated morphologies. (c) Independent, pit-like traces at a diode voltage of 304 kV and diode current of 1.58 kA. (d) Three-dimensional morphologies of corrugated morphologies. (e) Three-dimensional morphologies of independent, pit-like traces.