Analysis of Destructive Effects with Electron Bombardment in Slow-Wave Structures

Figure 9

Microscopy images of damage traces on the titanium-alloy’s witness plates using a SEM (a, b) and a CLSM (c, d). (a) Corrugated morphologies appear at a diode voltage of 166 kV and diode current of 1.58 kA. (b) Independent, pit-like traces at a diode voltage of 303 kV and diode current of 1.60 kA. (c) Three-dimensional morphologies of corrugated morphologies. (d) Three-dimensional morphologies of independent, pit-like traces.

(a)

(b)

(c)

(d)