Software Defect Prediction and Analysis Using Enhanced Random Forest (extRF) Technique: A Business Process Management and Improvement Concept in IOT-Based Application Processing Environment

<div>Combination of LDS, SVM, EM, and CMN.</div>

Mobile Information Systems

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Figure 4: Software Defect Prediction and Analysis Using Enhanced Random Forest (extRF) Technique: A Business Process Management and Improvement Concept in IOT-Based Application Processing Environment 

Figure 4 | Software Defect Prediction and Analysis Using Enhanced Random Forest (extRF) Technique: A Business Process Management and Improvement Concept in IOT-Based Application Processing Environment 