Research Article

Qualitative Simulation of the Growth of Electrolessly Deposited Cu Thin Films

Figure 6

(a) Void formation occurs at 𝐹 = 3 for a 2 : 1 aspect ratio feature. (b) Void-free filling is achieved at 𝐹 = 0 . 5 .
528351.fig.006a
(a)
528351.fig.006b
(b)