Research Article

Novel Model Based on Stacked Autoencoders with Sample-Wise Strategy for Fault Diagnosis

Table 5

Detailed results of SAE-SWS-s in the TE process.

Fault NumberTraining Accuracy (%)Testing Accuracy (%)

IDV 199.2399.13
IDV 297.0296.38
IDV 499.1197.75
IDV 599.7099.25
IDV 699.7086.25
IDV 710099.88
IDV 895.5345.13
IDV 1094.6443.88
IDV 1183.3369.13
IDV 1294.6476.75
IDV 1397.6220.50
IDV 1495.5395.13
IDV 1697.9283.25
IDV1792.2891.38
IDV 1885.4272.50
IDV 1989.5875.75
IDV 2082.7471.00
Normal63.1437.25