Defect Contour Detection of Complex Structural Chips

Table 2

Comparison on cost time.

Illumination situation	Machine assessment		Artificial assessment (s)
	YOLO v4 (s)	Ours (s)
Normal illumination	9.8	15.2	57.2
Weak illumination	9.4	15.9	60.7
Strong illumination	9.5	16.1	61.3