Research on Low-Resistance Grounding Fault Line Selection Based on VMD with PE and K-Means Clustering Algorithm

Table 2

Cluster validation analysis of simulation experiment.

		RN/Ω	Line	Distance from fault Di1	Distance from nonfault Di2	Is it faulty?
Different fault distances (L/km)	8	5	Line 1	3.155	0.316	No
			Line 2	3.088	0.755	No
			Line 3	1.142	2.988	Yes
	9	5	Line 1	3.027	0.809	No
			Line 2	2.956	0.651	No
			Line 3	1.014	2.982	Yes
	8	15	Line 1	3.560	2.007	No
			Line 2	3.206	0.900	No
			Line 3	3.296	4.759	Yes
	9	15	Line 1	3.202	1.196	No
			Line 2	3.241	1.118	No
			Line 3	2.233	3.972	Yes
Different transition resistances (Rg/Ω)	Metal grounding	5	Line 1	3.182	0.690	No
			Line 2	3.219	0.825	No
			Line 3	1.064	2.959	Yes
	50	5	Line 1	3.158	0.388	No
			Line 2	2.509	1.044	No
			Line 3	0.518	2.911	Yes
	100	5	Line 1	3.131	0.457	No
			Line 2	2.932	1.113	No
			Line 3	0.295	2.903	Yes
	500	5	Line 1	3.211	0.656	No
			Line 2	3.091	0.834	No
			Line 3	0.292	2.903	Yes
	1000	5	Line 1	3.266	0.722	No
			Line 2	3.150	0.827	No
			Line 3	0.192	2.909	Yes
	2000	5	Line 1	3.269	0.723	No
			Line 2	3.231	0.827	No
			Line 3	0.442	2.899	Yes
	Metal grounding	15	Line 1	3.434	0.814	No
			Line 2	3.376	0.850	No
			Line 3	0.543	2.954	Yes
	50	15	Line 1	3.291	1.017	No
			Line 2	3.217	0.901	No
			Line 3	1.510	3.511	Yes
	100	15	Line 1	3.021	0.664	No
			Line 2	2.510	1.048	No
			Line 3	0.621	2.956	Yes
	500	15	Line 1	3.042	0.698	No
			Line 2	2.677	1.006	No
			Line 3	0.670	2.955	Yes
	1000	15	Line 1	3.072	0.802	No
			Line 2	2.746	0.962	No
			Line 3	0.233	3.036	Yes
	2000	15	Line 1	3.121	0.959	No
			Line 2	2.720	0.895	No
			Line 3	0.326	3.058	Yes
	High resistance arc grounding	5	Line 1	3.206	1.170	No
			Line 2	2.692	0.912	No
			Line 3	0.254	3.028	Yes
		15	Line 1	3.228	1.174	No
			Line 2	2.701	0.907	No
			Line 3	0.429	3.073	Yes