Research on Low-Resistance Grounding Fault Line Selection Based on VMD with PE and K-Means Clustering Algorithm

Table 4

Analysis of cluster analysis test results of true test field.

		RN/Ω	Line	Distance from fault Di1	Distance from nonfault Di2	Is it faulty?
Different fault distances (L/km)	5	10	Line 1	0.108	2.926	Yes
			Line 2	3.251	1.113	No
			Line 3	3.257	1.212	No
	7	10	Line 1	0.340	3.000	Yes
			Line 2	3.231	1.113	No
			Line 3	3.385	1.173	No
	5	15	Line 1	0.310	2.989	Yes
			Line 2	3.296	1.047	No
			Line 3	3.654	2.242	No
	7	15	Line 1	1.083	3.249	Yes
			Line 2	3.193	0.971	No
			Line 3	3.239	0.807	No
Different transition resistances (Rg/Ω)	Metallic ground	10	Line 1	0.108	2.926	Yes
			Line 2	3.251	1.113	No
			Line 3	3.257	1.212	No
	50	10	Line 1	0.775	2.974	Yes
			Line 2	2.716	1.196	No
			Line 3	3.023	0.726	No
	100	10	Line 1	0.048	2.968	Yes
			Line 2	3.080	1.279	No
			Line 3	3.093	0.698	No
	500	10	Line 1	0.119	2.969	Yes
			Line 2	3.167	1.044	No
			Line 3	3.397	1.488	No
	1000	10	Line 1	0.119	2.969	Yes
			Line 2	3.192	0.971	No
			Line 3	3.426	1.444	No
	2000	10	Line 1	0.185	2.939	Yes
			Line 2	2.512	1.246	No
			Line 3	3.300	0.584	No
	Metallic ground	15	Line 1	0.310	2.989	Yes
			Line 2	3.296	1.047	No
			Line 3	3.654	2.242	No
	50	15	Line 1	0.998	3.004	Yes
			Line 2	2.831	1.378	No
			Line 3	3.048	0.684	No
	100	15	Line 1	0.050	2.960	Yes
			Line 2	2.713	1.117	No
			Line 3	3.135	0.849	No
	500	15	Line 1	0.215	2.994	Yes
			Line 2	2.798	1.153	No
			Line 3	3.221	0.672	No
	1000	15	Line 1	0.112	2.976	Yes
			Line 2	2.845	1.211	No
			Line 3	3.194	0.639	No
	2000	15	Line 1	0.408	3.027	Yes
			Line 2	2.994	1.387	No
			Line 3	3.228	0.783	No
	High resistance arc grounding	10	Line 1	1.129	2.992	Yes
			Line 2	3.162	1.116	No
			Line 3	3.325	1.493	No
		15	Line 1	0.176	2.885	Yes
			Line 2	3.231	0.971	No
			Line 3	3.248	1.146	No