Research Article
Research on Low-Resistance Grounding Fault Line Selection Based on VMD with PE and K-Means Clustering Algorithm
Table 5
Discriminating line selection results of faulty lines under different algorithms.
| Algorithm | R/Ω | RN/Ω | Line | Distance from fault Di1 | Distance from nonfault Di2 | Is it faulty? |
| VMD-PE-K-means (method 1) | 0 Ω | 10 Ω | Line 1 | 0.108 | 2.926 | Yes | 100 Ω | 10 Ω | Line 1 | 0.048 | 2.968 | Yes | 500 Ω | 10 Ω | Line 1 | 0.119 | 2.969 | Yes |
| EMD-PE-K-means (method 2) | 0Ω | 10 Ω | Line 1 | 0.524 | 1.917 | Yes | 100 Ω | 10 Ω | Line 1 | \ | \ | Indistinguishable | 500 Ω | 10 Ω | Line 1 | \ | \ | Indistinguishable |
| EEMD-PE-K-means (method 3) | 0Ω | 10 Ω | Line 1 | 0.560 | 1.917 | Yes | 100 Ω | 10 Ω | Line 1 | 0.540 | 1.904 | Yes | 500 Ω | 10 Ω | Line 1 | \ | \ | Indistinguishable |
| HHT-PE-K-means (method 4) | 0Ω | 10 Ω | Line 1 | 0.124 | 0.133 | Yes | 100 Ω | 10 Ω | Line 1 | 0.129 | 0.135 | Yes | 500 Ω | 10 Ω | Line 1 | \ | \ | Indistinguishable |
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