Machine Learning and Statistical Methods for Studying Voids and Photothermal Effects of a Semiconductor Rotational Medium with Thermal Relaxation Time

Table 11

The accuracy measurements for cubic spline models of the imaginary (Im) parts of the horizontal displacement components.

		(photothermal)	(photothermal)	(nonphotothermal)	(nonphotothermal)
Im (u)	SMAPE	3.26E − 05	3.55E − 05	3.27E − 05	5.69E − 05
	MASE	0.860451	1.075861	1.142913	4.810742
	MAPE	1.69881	3.285466	2.821202	4.276973
Im ( )	SMAPE	6.59E − 06	1.30E − 05	7.28E − 06	1.48E − 05
	MASE	0.032646	0.031188	0.032157	0.030266
	MAPE	0.011694	0.010957	0.010679	0.01026
Im ()	SMAPE	0.0851	0.1459	0.1866	0.2026
	MASE	0.6858	1.4009	0.5909	0.7221
	MAPE	0.2210	0.5610	0.6305	0.8968
Im ()	SMAPE	6.06E − 05	5.45E − 05	5.66E − 05	4.65E − 05
	MASE	10.170402	10.02873667	9.334621607	7.56075913
	MAPE	0.361733	0.221326	0.27026	1.197851
Im ()	SMAPE	2.22222E − 05	3.43434E − 05	2.62626E − 05	4.0404E − 05
	MASE	10.33146	10.09063324	10.29436269	4.0404E-05
	MAPE	0.570035	6.393111	0.443825	0.627785
Im (T)	SMAPE	1.72414E − 07	1.19812E − 07	5.64606E − 08	5.96303E − 08
	MASE	1.198816978	1.376388285	0.848361421	0.945056408
	MAPE	0.282599	0.201004	0.263407	0.342063
Im (N)	SMAPE	1.14684E − 06	6.28596E − 07	0.000837008	0.00094504
	MASE	1.219652997	1.813691422	0.150896213	0.076863319
	MAPE	0.295069	0.242391	0.116725	0.302983