Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy

Figure 10

(a), (b), and (c) EFM () detection electrical signal for PS and PS with 60 nm and 200 nm Al₂O₃, respectively; (d) Cross-sectional topography profiles and (e) EFM signal for studied PS particles at = 3.5 V and = 30 nm.

(a)

(b)

(c)

(d)

(e)