Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles

<div>Schematic representation of the experiment on the CAFM investigation of the resistive switching in the YSZ:NP-Au/SiO<sub>2</sub>/<i>n</i><sup>+</sup>-Si(100) films.</div>

Scanning

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Figure 1

Figure 1: Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles 