Residual Stress and Microstructure Characterization of 34CrMo4 Steel Modified by Shot Peening

Figure 1

Topmost layer TEM sample preparation of (a–d) schematic diagrams and (e–h) corresponding real sample images. (a, e) Shot-peened specimen, face-to-face pasted sample of (b, f) specimen side and (c, g) Cu grid side, and (d) schematic diagram of TEM specimen in the ion milling holder and (h) final TEM specimen with a hole in the center.

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