Research Article

Preventing Scan-Based Side-Channel Attacks by Scan Obfuscating with a Configurable Shift Register

Table 6

Comparison of different secure scan design. Note: LOC denotes “launch-on-capture.”

DesignArea overhead (%)VulnerabilityProbability of brute forceTest application

Proposed (64 bit authorization code)0.18None2−64(64 is the length of test authorization code)All types of tests can be applied
MKR [30]0.19NoneBrute force is inapplicableOnline testing cannot be applied
Mode reset [49]∼10Test-mode-only attacksBrute force is inapplicableOnline testing cannot be applied
Scan chain encryption [40]2.92Memory attack2m(m is the length of test password)All types of tests can be applied
FTSL-64 [59]3.09None2–64Loc delay testing cannot be applied