Research Article
Encoding Test Pattern of System-on-Chip (SOC) Using Annular Scan Chain
Table 1
Compatibility analysis among test patterns.
| | Number | Test pattern | Bits | Mode1 | Mode2 | Encode |
| | T4 | 01x1001101101000110101010101001111001010 | 3 | 0 | — | Seed | | T1 | 0100x11001101101000110101010101001111001 | 2 | 1 | 1 | 0011 | | T2 | 10101100011x0100101110010101010101100001 | 4 | 1 | 0 | 0010 | | T9 | 000110101100011x010010111001010101010110 | 2 | 1 | 1 | 0100 | | T7 | 01111001010011100x1011010001101010101010 | 5 | 1 | 0 | 0010 | | T8 | 01010011x1001010011100110110100011010101 | 2 | 1 | 1 | 0101 | | T3 | 010101001x110010100111001101101000110101 | 8 | 1 | 1 | 0010 | | T5 | 001101010101x100111100101001110011011010 | 4 | 1 | 1 | 1000 | | T6 | 10100011010101x1010011110010100111001101 | (10) | 1 | 1 | 0100 |
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