Overview on Radiation Damage Effects and Protection Techniques in Microelectronic Devices

Table 1

Radiation environment, radiation particles, radiation effects and test simulators [14].

Radiation environment	Radiation particle	Failure mechanism	Test simulation mechanism
Space environment	10 Mev∼100 Mev electrons, protons	Total dose effect	^60Co-γ
			Low energy X-ray device
	100 Mev∼several GeV electrons, protons	Single particle effect	Cyclotron
Nuclear explosion	Tens to hundreds of grays	Total dose effect	^60Co-γ
			Low energy X-ray device
	100 keV∼several MeV neutron flux	Displacement damage	Nuclear reactor
		Single particle effect
Reactor	Steady state neutron flux	Displacement damage	Nuclear reactor
	Several MeV gamma rays	Total dose effect	^60Co-γ
			Low energy X-ray device